Journal of Scientific and Industrial Metrology

Research Article: JMT (001)

Modeling of Optical Properties of Black Silicon/Crystalline Silicon

Author(s): Nuggehalli M Ravindra, Sita Rajyalaxmi Marthi,Suramya Sekhri

DOI: 10.21767/2472-1948.100001

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Editorial: JMT (002)

Examples of Role of Metrology in Materials Science & Engineering

Author(s): Nuggehalli M Ravindra

DOI: 10.21767/2472-1948.100002

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Short Communication: JMT (003)

Influence of the Spectrophotometer on Readings and Results Obtained from Commercial Equipment when using ELISA Post Interferon Gamma Release Assay for in vitro Diagnosis of Human Tuberculosis

Author(s): Rogério Reis Conceição

DOI: 10.21767/2472-1948.100003

Abstract | Full-Text | PDF

Research Article: JMT (004)

A Review of NIST Projects in Surface and Topography Metrology for Firearm Evidence Identification in Forensic Science

Author(s): John Song

DOI: 10.21767/2472-1948.100004

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Commentary: JMT (005)

Ultrafast Optical Sampling Finds Applications in Precision Measurement

Author(s): Lingze Duan

DOI: 10.21767/2472-1948.100005

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Research Article: JMT (006)

Metrological modeling of colorimetric measurements results of in hardware and software environments

Author(s): Yauheniya Saukova

DOI: 10.21767/2472-1948.100006

Abstract | Full-Text | PDF