Absorbing materials are widely applied in applications of wireless communication. It is of great importance to measure and characterize these materials efficiently and precisely. In this paper, the author first utilizes transmission line methods to acquire scattering parameters, which are used as input in the parameter retrieval process for EM properties. After successful characterization of these materials, EM properties are imported in commercialized software for simulation of reflectivity. For comparison, NRL arch reflectivity test is conducted and good comparison is found. Discrepancy between the two is analyzed in this paper.
Tian Zhou*, Dong Wel, Songtao Yang, Guanxiong Xu, Chunlin Ji and Zhiya Zhao
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